We recently had the pleasure of welcoming Jack Xu from WHEC at our office for an interesting exchange about Contact Image Sensor (CIS) technology and its potential for industrial surface inspection.
We’re always exploring different imaging technologies to find the right solution for each application. One example is our PS Line Scan Solution in its CIS configuration, where we combine CIS technology with our PS Line Light to bring the advantages of Photometric Stereo to a compact line-scan inspection setup. It’s an interesting approach for applications where installation space, image quality, and reliable surface defect detection are key considerations.
We really enjoyed the technical discussions and exchanging ideas about possible applications and future developments. Thanks for stopping by, we’re looking forward to staying in touch and exploring what’s possible!