PS Line Scan Solution combines the advantages of photometric stereo for surface inspection with the high-speed capabilities of line scan imaging. Using the framegrabber’s FPGA the photometric stereo images are calculated without any CPU load (up to 3.6 GB/s).
Its modular and scalable architecture supports easy integration of multiple synchronized cameras or contact image sensor. It also supports additional illumination configurations like darkfield, backlight or multispectral setups.
At its core is the optimized PS Line Light, designed for high brightness, narrow beam angles, and steep tilt – ideal for revealing fine topographic and textural details, even on dark or challenging surfaces.
The complete PS Line Scan Solution offers flexible system configurations with variable inspection lengths, adaptable camera setups, and selectable illumination wavelengths, including:
Comprehensive accessories enabling fast and seamless mechanical, electrical, and software integration
In line scan applications, image acquisition is performed under relative motion between object and camera. The MultiChannel functionality enables the successive acquisition of images under different illumination conditions with a minimal physical offset of less than one pixel. Despite this extremely small displacement, artefacts can occur in the curvature image, particularly in regions with strong contrast in the albedo image. To address this, a specifically designed algorithm implemented within the FPGA significantly reduces these artefacts while maintaining high processing performance.
Surface quality is critical in decorative and natural materials. PS Line Scan Solution enables separate inspection of texture and topography to detect defects such as dents, embossing flaws, scratches, or surface irregularities, even at high processing speeds, ensuring consistent, high-end appearance.
In E-Mobility manufacturing,, even the smallest topographic deviation can affect performance. PS Line Scan Solution enables high-resolution, in-motion inspection of bipolar plates, revealing fine defects that impact sealing, conductivity, or structural integrity.
PS Line Scan Solution inspects surface and contour defects during stamping or forming, whether in cyclic or continuous motion. It integrates easily into high-speed lines and supports optional dual-sided inspection, making it ideal for electronic or precision metal components.
For blister packs, foil seals, and printed cartons, PS Line Scan Solution detects fine topographic and surface defects such as wrinkles, embossing flaws, or delamination. High-speed, non-contact inspection ensures consistent packaging quality, critical for regulatory compliance and brand protection.